Helium Scanning Transmission Ion Microscopy and Electrical...

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ACS Nano 2016 / 01

Helium Scanning Transmission Ion Microscopy and Electrical Characterization of Glass Nanocapillaries with Reproducible Tip Geometries

Zweifel, Ludovit P, Shorubalko, Ivan, Lim, Roderick Y.H.
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Language:
english
Journal:
ACS Nano
DOI:
10.1021/acsnano.5b05754
Date:
January, 2016
File:
PDF, 1.10 MB
english, 2016
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