![](/img/cover-not-exists.png)
Two-Level Designs to Estimate All Main Effects and Two-Factor Interactions
Eendebak, Pieter T., Schoen, Eric D.Language:
english
Journal:
Technometrics
DOI:
10.1080/00401706.2016.1142903
Date:
January, 2016
File:
PDF, 1.04 MB
english, 2016