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Accurate Lifetime Estimation of Sub-20-nm NAND Flash Memory
Lee, Kyunghwan, Kang, Myounggon, Hwang, Yuchul, Shin, HyungcheolYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2509004
File:
PDF, 3.35 MB
english, 2016