Single Event Susceptibility Analysis in CBRAM Resistive Memory Arrays
Mahalanabis, Debayan, Liu, Rui, Barnaby, Hugh J., Yu, Shimeng, Kozicki, Michael N., Mahmud, Adnan, Deionno, EricaVolume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2478382
Date:
December, 2015
File:
PDF, 929 KB
english, 2015