Analysis of Angular Dependence of Single-Event Latchup...

IEEE Transactions on Nuclear Science 2015 / 12 Vol. 62; Iss. 6

Analysis of Angular Dependence of Single-Event Latchup Sensitivity for Heavy-Ion Irradiations of ${\hbox{0.18-}}\mu\hbox{m}$ CMOS Technology

Artola, L., Roche, N. J.-H., Hubert, G., Al Youssef, A., Khachatrian, A., McMarr, P., Hughes, H.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2495101
Date:
December, 2015
File:
PDF, 1.13 MB
english, 2015
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