SPIE Proceedings [SPIE Applied Optics and Photonics China...

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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Measurement and analysis of sky background spectra in passive ranging

Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Yu, Zhang, Liu, Bingqi, Yu, Hao, Li, Xiaoming, Yan, Zongqun, Hua, Wenshen, Shi, Yunsheng, Chen, Yichao
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Volume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2196928
File:
PDF, 305 KB
english, 2015
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