![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Testing and Metrology - Three-Dimensional Surface Metrology Using A Computer Controlled Non-Contact Instrument
Wyant, James C., Prettyjohns, Keith N., Grover, Chander P.Volume:
661
Year:
1986
Language:
english
DOI:
10.1117/12.938628
File:
PDF, 3.69 MB
english, 1986