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Microwave Imaging Reflectometry for the study of Edge Harmonic Oscillations on DIII-D
Ren, X., Chen, M., Chen, X., Domier, C.W., Ferraro, N.M., Kramer, G.J., Jr., N.C. Luhmann, Muscatello, C.M., Nazikian, R., Shi, L., Tobias, B.J., Valeo, E.Volume:
10
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/10/P10036
Date:
October, 2015
File:
PDF, 2.99 MB
english, 2015