Memory Access Time and Input Size Effects on Parallel...

IEEE Transactions on Nuclear Science 2015 / 12 Vol. 62; Iss. 6

Memory Access Time and Input Size Effects on Parallel Processors Reliability

Pilla, Laercio L., Oliveira, Daniel A. G., Lunardi, Caio, Navaux, Philippe O. A., Carro, Luigi, Rech, Paolo
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2496381
Date:
December, 2015
File:
PDF, 1014 KB
english, 2015
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