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Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening
Chen, Hongqiang, Yao, Y. Lawrence, Kysar, Jeffrey W.Volume:
126
Year:
2004
Language:
english
Journal:
Journal of Manufacturing Science and Engineering
DOI:
10.1115/1.1751189
File:
PDF, 439 KB
english, 2004