Nonlocality Effect in Atomic Force Microscopy Measurement...

Nonlocality Effect in Atomic Force Microscopy Measurement and Its Reduction by an Approaching Method

Hu, Ming, Wang, Haiying, Xia, Mengfen, Ke, Fujiu, Bai, Yilong
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Volume:
127
Year:
2005
Language:
english
Journal:
Journal of Engineering Materials and Technology
DOI:
10.1115/1.1925290
File:
PDF, 179 KB
english, 2005
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