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Nanoscale Deformation Analysis With High-Resolution Transmission Electron Microscopy and Digital Image Correlation
Wang, Xueju, Pan, Zhipeng, Fan, Feifei, Wang, Jiangwei, Liu, Yang, Mao, Scott X., Zhu, Ting, Xia, ShumanVolume:
82
Language:
english
Journal:
Journal of Applied Mechanics
DOI:
10.1115/1.4031332
Date:
September, 2015
File:
PDF, 5.68 MB
english, 2015