Parameter Calibrations on MOSFET Stress Sensors

Journal of Electronic Packaging 2012 Vol. 134; Iss. 3

Parameter Calibrations on MOSFET Stress Sensors

Tan, Ren-Tzung, Chung, Hsien, Lwo, Ben-Je, Tang, Chun-Pai, Tseng, Kun-Fu
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Volume:
134
Year:
2012
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.4006888
File:
PDF, 1.98 MB
english, 2012
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