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[ASME ASME 2002 International Mechanical Engineering Congress and Exposition - New Orleans, Louisiana, USA (November 17–22, 2002)] Microelectromechanical Systems - Thermal, Electrical, and Thermoelectric Measurements by Scanning Probe Microscopy
Miner, Andrew C., Chapp, Michael, Li, Deyu, Majumdar, ArunVolume:
2002
Year:
2002
Language:
english
DOI:
10.1115/imece2002-33289
File:
PDF, 2.95 MB
english, 2002