SPIE Proceedings [SPIE Optics in Computing '98 - Brugge, Belgium (Wednesday 17 June 1998)] Optics in Computing '98 - Inspection of fabric resistance to abrasion by Fourier analysis
Escofet, Jaume, Millan Garcia-Verela, Maria S., Abril, Hector C., Torrecilla, E., Chavel, Pierre H., Miller, David A. B., Thienpont, HugoVolume:
3490
Year:
1998
Language:
english
DOI:
10.1117/12.308923
File:
PDF, 1.34 MB
english, 1998