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Logistic Regression Ensemble for Predicting Customer Defection with Very Large Sample Size
Kuswanto, Heri, Asfihani, Ayu, Sarumaha, Yogi, Ohwada, HayatoVolume:
72
Year:
2015
Language:
english
Journal:
Procedia Computer Science
DOI:
10.1016/j.procs.2015.12.108
File:
PDF, 241 KB
english, 2015