Yield and Deformation in Biaxially Stressed Multilayer Metallic Thin Films
Overman, N. R., Overman, C. T., Zbib, H. M., Bahr, D. F.Volume:
131
Year:
2009
Language:
english
Journal:
Journal of Engineering Materials and Technology
DOI:
10.1115/1.3183775
File:
PDF, 495 KB
english, 2009