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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Videometrics V - Line-scan system for all-round inspection of objects
Zographos, Anastasios N., Evans, J. Paul O., Godber, Simon X., Robinson, Max, El-Hakim, Sabry F.Volume:
3174
Year:
1997
Language:
english
DOI:
10.1117/12.279789
File:
PDF, 1.46 MB
english, 1997