Numerical modelling of electrostatic force microscopes...

COMPEL Int J for Computation and Maths in Electrical and Electronic Eng 2009 / 01 Vol. 28; Iss. 1

Numerical modelling of electrostatic force microscopes considering charge and dielectric constant

Gratkowski, Stanislaw, Binit Bala, Uzzal, Greiff, Michael, Preisner, Thomas, Mathis, Wolfgang
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Volume:
28
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/03321640910918913
Date:
January, 2009
File:
PDF, 230 KB
english, 2009
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