[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure localization on a Low-Dropout Voltage Regulator with Reset Automotive Device due to wire bonding issue
Galarce, Rowin V., Vagues, Lynn ColetteYear:
2015
Language:
english
DOI:
10.1109/IPFA.2015.7224392
File:
PDF, 1.01 MB
english, 2015