Utilizing the SIMS technique in the study of grain boundary...

Acta Materialia 2002 Vol. 50; Iss. 20

Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

S.M. Schwarz, B.W. Kempshall, L.A. Giannuzzi, F.A. Stevie
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s1359-6454(02)00362-2
File:
PDF, 110 KB
english, 2002
Conversion to is in progress
Conversion to is failed