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Improved Reliability of InGaN-Based Light-Emitting Diodes by HfO2 Passivation Layer
Park, Seung Hyun, Kim, Yoon Seok, Kim, Tae Hoon, Ryu, Sang WanVolume:
16
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2016.12030
Date:
February, 2016
File:
PDF, 357 KB
english, 2016