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A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors
Nie, Kaiming, Li, Jianxin, Gao, Zhiyuan, Xu, JiangtaoLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.01.008
Date:
January, 2016
File:
PDF, 1.70 MB
english, 2016