Measurement of mobility and lifetime of electrons and holes...

Journal of Instrumentation 2014 / 12 Vol. 9; Iss. 12

Measurement of mobility and lifetime of electrons and holes in a Schottky CdTe diode

Ariño-Estrada, G, Chmeissani, M, de Lorenzo, G, Kolstein, M, Puigdengoles, C, García, J, Cabruja, E
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Volume:
9
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/9/12/C12032
Date:
December, 2014
File:
PDF, 240 KB
english, 2014
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