[IEEE 2015 IEEE Radiation Effects Data Workshop (REDW) - Boston, MA, USA (2015.7.13-2015.7.17)] 2015 IEEE Radiation Effects Data Workshop (REDW) - Radiation Evaluation of Ferroelectric Random Access Memory Embedded in 180nm CMOS Technology
Dahl, B. A., Cruz-Colon, J., Baumann, R. C., Rodriguez, J. A., Zhou, C., Rodriguez-Latorre, J., Khan, S., San, T., Trinh, T.Year:
2015
Language:
english
DOI:
10.1109/REDW.2015.7336729
File:
PDF, 1.27 MB
english, 2015