Suppressed Instability of a-IGZO Thin-Film Transistors Under Negative Bias Illumination Stress Using the Distributed Bragg Reflectors
Kim, Eungtaek, Jang, Woo Jae, Kim, Woohyun, Park, Junhong, Lee, Myung Keun, Park, Sang-Hee Ko, Choi, Kyung CheolYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2513414
File:
PDF, 2.06 MB
english, 2016