SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Instruments for Optics and Optoelectronic Inspection and Control - Photoluminescence spectrum measurement of GaAs photocathode material
Guo, Hui, Pravdivtsev, Vitaly, Wei, Guang Hui, Liu, ShengVolume:
4223
Year:
2000
Language:
english
DOI:
10.1117/12.401782
File:
PDF, 93 KB
english, 2000