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SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Determination of optical constants and thickness of Nb2O5 optical films from normal incidence transmission spectra
Lin, Limei, Lai, Fachun, Huang, Zhiago, Qu, Yan, Gai, Rongquan, Yang, Li, Wen, Shangming, Chen, Yaolong, Kley, Ernst-BernhardVolume:
6149
Year:
2006
Language:
english
DOI:
10.1117/12.674262
File:
PDF, 310 KB
english, 2006