Reliability of an ultra-fine-pitch COF flip-chip package using non-conductive paste
Kim, Hae-Yeon, Min, Kyung-Eun, Lee, Jun-Sik, Lee, So-Jeong, Lee, Sung-Soo, Kim, Jun-KiVolume:
12
Language:
english
Journal:
Electronic Materials Letters
DOI:
10.1007/s13391-015-2235-1
Date:
January, 2016
File:
PDF, 1.30 MB
english, 2016