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Gap states density measurement in copper oxide thin films
Lamri Zeggar, M., Messaoudi, M., Aida, M.S., Attaf, N.Volume:
45
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2016.01.007
Date:
April, 2016
File:
PDF, 369 KB
english, 2016