Electronic structure investigation of Al 0.7...

Electronic structure investigation of Al 0.7 Ga 0.3 As/GaAs nanometric heterostructures by Kelvin force microscopy

Pouch, S., Triozon, F., Chevalier, N., Mélin, T., Niquet, Y.-M., Borowik, Ł.
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Volume:
6
Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/C5RA24505B
File:
PDF, 1.32 MB
english, 2016
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