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A predictive model for wafer probe burn phenomenon
Zafer, Baha, Tunaboylu, BahadırVolume:
98
Language:
english
Journal:
Applied Thermal Engineering
DOI:
10.1016/j.applthermaleng.2015.12.083
Date:
April, 2016
File:
PDF, 1.41 MB
english, 2016