![](/img/cover-not-exists.png)
Nonlinearity analysis of TaOX redox-based RRAM
Kim, Wonjoo, Rösgen, Bernd, Breuer, Thomas, Menzel, Stephan, Wouters, Dirk, Waser, Rainer, Rana, VikasVolume:
154
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2016.01.025
Date:
March, 2016
File:
PDF, 1.41 MB
english, 2016