Characterization of phase change material systems using a...

Microelectronics Journal 2015 / 12 Vol. 46; Iss. 12

Characterization of phase change material systems using a thermal test device

Jordà, Xavier, Esarte, Jesús, Perpiñà, Xavier, Vellvehi, Miquel, Argandoña, Gorka, Aresti, Maite
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Volume:
46
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2015.09.022
Date:
December, 2015
File:
PDF, 4.48 MB
english, 2015
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