SPIE Proceedings [SPIE International Symposium on Optical Fabrication, Testing, and Surface Evaluation - Tokyo, Japan (Wednesday 10 June 1992)] Intl Symp on Optical Fabrication, Testing, and Surface Evaluation - Analysis of zone-plate interference fringe pattern
Kamiya, Kazuhide, Nomura, Takashi, Miyashiro, Hiroshi, Yoshikawa, Kazuo, Tashiro, Hatsuzo, Ozono, Shigeo, Suzuki, Masane, Tsujiuchi, JumpeiVolume:
1720
Year:
1992
Language:
english
DOI:
10.1117/12.132138
File:
PDF, 175 KB
english, 1992