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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - Graded multilayers for fully polarization resolved resonant inelastic x-ray scattering in the soft x-ray range
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Morawe, C., Peffen, J.-C., Supruangnet, R., Braicovich, L., Brookes, N. B., Ghiringhelli, G., Yakhou-Harris, F.Volume:
9207
Year:
2014
Language:
english
DOI:
10.1117/12.2061827
File:
PDF, 870 KB
english, 2014