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SPIE Proceedings [SPIE Seventh International Symposium on Precision Mechanical Measurements - Xia'men, China (Saturday 8 August 2015)] Seventh International Symposium on Precision Mechanical Measurements - Surface defect inspection of TFT-LCD panels based on 1D Fourier method

Yu, Liandong, Zhang, Teng-da, Lu, Rong-sheng
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Volume:
9903
Year:
2016
Language:
english
DOI:
10.1117/12.2217642
File:
PDF, 425 KB
english, 2016
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