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A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects
Pardoen, Thomas, Colla, Marie-Sthéphane, Idrissi, Hosni, Amin-Ahmadi, Behnam, Wang, Binjie, Schryvers, Dominique, Bhaskar, Umesh K., Raskin, Jean-PierreVolume:
17
Journal:
Comptes Rendus Physique
DOI:
10.1016/j.crhy.2015.11.005
Date:
March, 2016
File:
PDF, 1.58 MB
2016