Electron-Induced Single Event Upsets in 28 nm...

IEEE Transactions on Nuclear Science 2015 / 12 Vol. 62; Iss. 6

Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

Trippe, J. M., Reed, R. A., Austin, R. A., Sierawski, B. D., Weller, R. A., Funkhouser, E. D., King, M. P., Narasimham, B., Bartz, B., Baumann, R., Labello, J., Nichols, J., Schrimpf, R. D., Weeden-Wr
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2496967
Date:
December, 2015
File:
PDF, 1.33 MB
english, 2015
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