SPIE Proceedings [SPIE SPIE Micro+Nano Materials, Devices, and Applications - Sydney, New South Wales, Australia (Sunday 6 December 2015)] Micro+Nano Materials, Devices, and Systems - Microscale resolution fracture toughness profiling at the zirconia-porcelain interface in dental prostheses
Eggleton, Benjamin J., Palomba, Stefano, Lunt, Alexander J. G., Mohanty, Gaurav, Neo, Tee K., Michler, Johann, Korsunsky, Alexander M.Volume:
9668
Year:
2015
Language:
english
DOI:
10.1117/12.2199217
File:
PDF, 1.90 MB
english, 2015