SPIE Proceedings [SPIE SPIE Micro+Nano Materials, Devices,...

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SPIE Proceedings [SPIE SPIE Micro+Nano Materials, Devices, and Applications - Sydney, New South Wales, Australia (Sunday 6 December 2015)] Micro+Nano Materials, Devices, and Systems - Optimisation of Schottky electrode geometry

Eggleton, Benjamin J., Palomba, Stefano, Luong, Stanley, Alnassar, Mohammad Saleh N., Yue, Pan, Holland, Anthony S.
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Volume:
9668
Year:
2015
Language:
english
DOI:
10.1117/12.2202531
File:
PDF, 1021 KB
english, 2015
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