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Luminescence measurements on MOS tunnel diodes as a method of finding the photon emission rates in silicon
N. Asli, S.V. Gastev, I.V. Grekhov, P. Seegebrecht, A.F. Shulekin, S.E. Tyaginov, M.I. Vexler, H. ZimmermannVolume:
3
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s1369-8001(00)00081-0
File:
PDF, 143 KB
english, 2000