Determination of recombination lifetime in MOS structures...

Determination of recombination lifetime in MOS structures by a sine voltage-sweep technique

P. Peykov, T. Diaz, M. Aceves
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Volume:
5
Year:
2002
Language:
english
Pages:
4
DOI:
10.1016/s1369-8001(02)00068-9
File:
PDF, 100 KB
english, 2002
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