SPIE Proceedings [SPIE Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015 - Hefei, Suzhou, and Harbin, China (Sunday 14 June 2015)] Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015 - Control and measuring system of a two-dimensional scanning nanopositioning stage based on LabVIEW

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