![](/img/cover-not-exists.png)
Quantitative detection of thermal barrier coating thickness based on simulated annealing algorithm using pulsed infrared thermography technology
Bu, Chiwu, Tang, Qingju, Liu, Yuanlin, Yu, Fengyun, Mei, Chen, Zhao, YaweiLanguage:
english
Journal:
Applied Thermal Engineering
DOI:
10.1016/j.applthermaleng.2016.01.143
Date:
February, 2016
File:
PDF, 904 KB
english, 2016