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[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - Genetic Algorithm and Machine Learning Based Void Fraction Measurement of Two-Phase Flow

Wang, Weiwei, Zhu, Xiaoqian, Wang, Ping, Fan, Shangchun, Ren, Dongshun
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Year:
2010
Language:
english
DOI:
10.1109/ICMTMA.2010.760
File:
PDF, 251 KB
english, 2010
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