SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Integrated Optics: Physics and Simulations - Analysis of parasitic effects in PICs using circuit simulation
Kleijn, Emil, Smit, Meint K., Leijtens, Xaveer J. M., Cheben, Pavel, Čtyroký, Jiří, Molina-Fernandez, IñigoVolume:
8781
Year:
2013
Language:
english
DOI:
10.1117/12.2016829
File:
PDF, 427 KB
english, 2013