SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control - Modeling of material outgassing and deposition phenomena
Urayama, Fumitaka, Hayashi, Tetsuya, Takeda, Naomichi, Baba, Naoko, Chen, Philip T. C., Fleming, John C., Dittman, Michael G.Volume:
5526
Year:
2004
Language:
english
DOI:
10.1117/12.561314
File:
PDF, 255 KB
english, 2004