Plasmid DNA Breakage by Decay of DNA-Associated Auger...

Plasmid DNA Breakage by Decay of DNA-Associated Auger Electron Emitters: Approaches to Analysis of Experimental Data

Lobachevsky, Pavel N., Karagiannis, Tom C., Martin, Roger F.
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Volume:
162
Language:
english
Journal:
Radiation Research
DOI:
10.1667/RR3187
Date:
July, 2004
File:
PDF, 196 KB
english, 2004
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