A New Short Channel MOSFET with an Atomic-Layer-Doped Impurity-Profile (ALD-MOSFET)
Yamaguchi, Ken, Shiraki, Yasuhiro, Katayama, Yoshifumi, Murayama, YoshimasaVolume:
22
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAPS.22S1.267
Date:
January, 1983
File:
PDF, 530 KB
1983